Spectrometers /

Benchtop XRF

Rigaku's ART division specializes in X-ray fluorescence (XRF) spectrometers employing energy dispersive detectors (EDXRF). XRF is an X-ray spectrometric technique for elemental analysis of a wide variety of materials. Other phrases for XRF instruments include: XRF analyzer, XRF spectrometer, XRF analysis, X-ray fluorescence analyzer, x-ray fluorescence spectrometry, fluorescence x, spectromètre de fluorescence X, Röntgenfluoreszenzanalyse, fluorescencia de rayos X, Röntgenfluoreszenz, Röntgenfluorescentie, Röntgenfluorescens, Röntgenfluoresenssi, Røntgenfluorescens and Promieniowanie rentgenowskie.

Typical uses of EDXRF include the analysis of petroleum oils and fuel, plastic, rubber and textiles, pharmaceutical products, foodstuffs, cosmetics and body care products, fertilizers, geological materials, mining feeds, slags and tails, cement, heat-resistant materials, glass, ceramics, catalysts, wafers; the determination of coatings on paper, film, polyester; metals and alloys, glass and plastic; forensics; multi-layer thin films on silicon wafers, photovoltaics and rotating storage media as well as pollution monitoring of solid waste, effluent, cleaning fluids, pools and filters. In addition, X-ray Transmission (XRT) process gauges are employed to measure sulfur (S) in crude oil and marine bunker fuel.

XRF and EDXRF spectrometers are the elemental analysis tool of choice, for many applications, in that they are smaller, simpler in design and cost less to operate than other technologies like inductively coupled plasma optical emission spectroscopy (ICP-OES) and atomic absorption (AA) or atomic fluorescence (AF) spectroscopy. Examples of some common EDXRF applications are: Cement and raw meal: sulfur, iron, calcium, silicon, aluminum, magnesium, etc; Kaolin clay: titanium, iron, aluminum, silicon, etc; Granular catalysts: palladium, platinum, rhodium, ruthenium, etc; Ores: copper, tin, gold, silver, etc; Cement and mortar fillers: sulfur in ash.

Other examples of common EDXRF applications include: Gasoline, diesel and RFG: sulfur, manganese, lead, etc; Residual gas oils: sulfur, chlorine, vanadium, nickel, etc; Secondary oil: chlorine, etc; Kerosine, naphtha: sulfur, etc; Crude oil and bunker fuels: sulfur, vanadium, nickel, etc; Plating, pickling & pre-treatment baths: gold, copper, rhodium, platinum, nickel, sulfates, phosphates, chlorides, etc; Acetic acid: magnesium, cobalt and bromine; Terephthalic acid (TPA): cobalt, manganese, iron, etc; Dimethyl terephthalate (DMT): heavy metals; PVC copolymer solutions: chlorine; Photographic emulsion: silver; Clay: metals and non-metals; Waste and effluent streams: RCRA metals, chlorides, phosphates, etc. Additionally, EDXRF and XRF are employed to quantify atomic elements in: Food, pet food and other animal feed: potassium, phosphorus and chlorine; Cosmetics: zinc, titanium, calcium, manganese, iron, silicon, phosphorus, sulfur, aluminum, and sodium; Wood treatment: CCA, Penta, ACQ, ACZA, phosphorus-based fire retardants, copper naphthanate, zinc napthanate, TBTO, IPBC and combinations of these; Antacids: calcium; and Toothpaste: phosphorus and tin.

NEX QC
Energy Dispersive X-ray Fluorescence Analyzer

New low cost benchtop EDXRF for rapid qualitative and quantitative elemental analysis

Rigaku NEX QC energy dispersive X-ray fluorescence (EDXRF) analyzer delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types:

  • Analyze ₁₁Na to ₉₂U non-destructively
  • Solids, liquids, alloys, powders and thin films
  • 50kV X-ray tube for wide elemental coverage
  • Semiconductor detector for superior data quality
  • Modern smartphone style "icon driven" user interface
  • Multiple automated tube filters for enhanced sensitivity
  • Convenient built in thermal printer
  • Low cost with unmatched performance-to-price ratio
  • Self-contained with built-in printer
Superior EDXRF capabilities with ease-of-use
As a premium low cost benchtop X-ray Fluorescence (XRF) analyzer, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control elemental analysis applications.

Specifically designed for routine quality control applications, the new Rigaku NEX QC features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience. The shuttered 50 kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD). Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.

Technical Data

X-ray Tube:
- 50kV X-ray tube, 4W max power
- 6 tube filter positions with shutter

Detector:
- Semiconductor detector
- Peltier thermo-electric cooling
- Optimum balance of spectral resolution and max count rate

Sample Chamber:
- Large 190 x 165 x 60 mm sample chamber
- Single position 32 or 40 mm sample aperture
- Bulk sample aperture 5/6-position 40/32 mm automatic sample changer
- Single position 32 mm sample spinner
- Analysis in air or helium

Environmental Conditions:
Ambient temperature 10-35ºC (50-95ºF)
Relative humidity ≤85% non-condensing

Software & Application Packages:
- Qualitative and quantitative analysis
- RPF-SQX fundamental parameters (Option)
- Data export function with LIMS compatibility
- User selectable shaping times
- Simple flow bar wizard to create new applications

User Interface
- QuantEZ software
- External PC computer
- Data export connections

Single phase AC 100/220V, 1.4A (50/60 Hz)

Dimensions: 33.1(W) X 43.2(D) X 37.6(H) cm (13 X 17 X 14.8 inch)

Weight: 16 kg (35 lbs)

Applications
  1. Sulfur in oil - ASTM D4294, IP 336, ISO 8745, ISO 20847, JIS K 2541-4
  2. Lead in Gasoline - ASTM D5059
  3. Lube oils - ASTM D6481
  4. Wood Treatment
  5. Phosphorus Fire Retardant on Fabric
  6. Silicone Coating on Paper/Plastic
  7. RoHS
  8. Cement
  9. Coatings
  10. Mining & refining
  11. Metals and alloys

NEX QC+ QuantEZ
Energy Dispersive X-ray Fluorescence

Windows®-based EDXRF for rapid elemental analysis
As a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.
Elemental analysis in the field, plant or lab
Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX QC+ QuantEZ series add to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants - such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma - the NEX QC+ QuantEZ series is the reliable choice for routine elemental analysis.
50kV X-ray tube and SDD detector
The shuttered 50kV X-ray tube and Peltier cooled Silicon Drift Detector (SDD) detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).
Options: autosampler, helium and FP
Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.
Features
  • Analyze ₁₁Na to ₉₂U non-destructively
  • Powerful QuantEZ Windows-based software
  • Solids, liquids, alloys, powders and films
  • 50kV X-ray tube for wide elemental coverage
  • SDD detector for superior resolution
  • Multiple automated tube filters
  • Unmatched performance-to-price ratio
  • Optional RPF-SQX fundamental parameters
Technical Data

X-ray Tube:
- 50kV X-ray tube, 4W max power
- 6 tube filter positions with shutter

Detector:
- High performance SDD detector
- Peltier thermo-electric cooling
- Optimum balance of spectral resolution and max count rate

Sample Chamber:
- Large 190 x 165 x 60 mm sample chamber
- Single position 32 or 40 mm sample aperture
- Bulk sample aperture 5/6-position 40/32 mm automatic sample changer
- Single position 32 mm sample spinner
- Analysis in air or helium

Environmental Conditions
Ambient temperature 10-35ºC (50-95ºF)
Relative humidity ≤85% non-condensing

Software & Application Packages
- Qualitative and quantitative analysis
- RPF-SQX fundamental parameters (optional)
- Data export function with LIMS compatibility
- User selectable shaping times
- Simple flow bar wizard to create new applications

User Interface
- QuantEZ software
- External PC computer
- Data export connections

Single phase AC 100/220V, 1.4A (50/60 Hz)

Dimensions: 33.1(W) X 43.2(D) X 37.6(H) cm (13 X 17 X 14.8 inch)

Weight: 16 kg (35 lbs)

Applications
  1. Sulfur in oil - ASTM D4294, IP 336, ISO 8745, ISO 20847, JIS K 2541-4, ISO 13032
  2. Lead in Gasoline - ASTM D5059
  3. Lube oils - ASTM D6481, ASTM 7751
  4. Wood Treatment
  5. Phosphorus Fire Retardant on Fabric
  6. Silicone Coating on Paper/Plastic
  7. RoHS
  8. Cement
  9. Coatings
  10. Mining & refining
  11. Metals and alloys
  12. Paint and pigments
  13. Education
  14. Catalysts
  15. Wovens and non-wovens

NEX DE
Energy Dispersive X-ray Fluorescence Spectrometer

Windows®-based EDXRF for rapid elemental analysis
As a premium high performance benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.
XRF elemental analysis in the field, plant or lab
Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE adds to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma - the NEX DE is the reliable high performance choice for routine elemental analysis by XRF.
XRF with 60 kV X-ray tube and SDD detector
The 60 kV X-ray tube and Peltier cooled FAST SDD® Silicon Drift Detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).
XRF options:
autosampler, vacuum, helium and standardless FP Options include fundamental parameters, a variety of automatic sample changers, sample spinner and helium purge or vacuum atmosphere for enhanced light element sensitivity.
*FAST SDD® is a registered trademark of Amptek, Inc.
Features
  • Analyze ₁₁Na to ₉₂U non-destructively
  • Powerful QuantEZ Windows-based software
  • Solids, liquids, alloys, powders and films
  • 60 kV X-ray tube for wide elemental coverage
  • FAST SDD® detector for superior data
  • Six automated tube filters
  • Unmatched performance-to-price ratio
  • Optional RPF-SQX fundamental parameters
Technical Data

X-ray Tube:
- 60kV X-ray tube, 12W max power
- 7 tube filter positions
- 10 mm collimator

Detector:
- High performance FAST SDD detector
- Peltier thermo-electric cooling
- High spectral resolution with very high count rates

Sample Chamber
- Large 30.5 (W) X 30.5 (D) x 10.5 (H) cm chamber
- Single position 32 or 40 mm sample aperture
- 15-position 32 mm automatic sample changer
- 10-position 40 mm automatic sample changer
- 9-position 50 mm automatic sample changer
- Single position 32 mm sample spinner
- Analysis in air, helium, or vacuum (single position)

Environmental Conditions
Ambient temperature 10-35ºC (50-95ºF)
Relative humidity ≤85% non-condensing

Software & Application Packages:
- Qualitative and quantitative analysis
- RPF-SQX fundamental parameters (optional)
- Data export function with LIMS compatibility
- User selectable shaping times
- Simple flow bar wizard to create new applications

User Interface:
- QuantEZ software
- External PC computer
- Data export connections

Single phase AC 100/220V, 1.5A (50/60 Hz)

Dimensions: 35.6(W) X 35.1(D) X 26.0(H) cm (14 X 13.8 X 10.2 inch)

Weight: <27 kg (<60 lbs)

Applications
  1. Sulfur in oil - ASTM D4294, IP 336, ISO 8745, ISO 20847, JIS K 2541-4, ISO 13032
  2. Lead in Gasoline - ASTM D5059
  3. Lube oils - ASTM D6481, ASTM 7751
  4. Wood Treatment
  5. Phosphorus Fire Retardant on Fabric
  6. Silicone Coating on Paper/Plastic
  7. RoHS
  8. Cement
  9. Coatings
  10. Mining & refining
  11. Metals and alloys
  12. Paint and pigments
  13. Education
  14. Catalysts
  15. Wovens and non-wovens

NEX DE VS
Energy Dispersive X-ray Fluorescence Spectrometer

Variable small spot plus camera EDXRF for elemental analysis
As a premium high performance, SMALL SPOT benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE VS delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, slurries and RoHS materials.
Multi-position, small spot & bulk elemental analysis
New Rigaku NEX DE VS elemental analyzer (EDXRF) offers multi-position bulk analysis in addition to a large single position sample stage, with three analysis spot size options — 1 mm, 3 mm and 10 mm — that are easily changeable by the system's automatic collimators. A high resolution camera and LED lighting system allows a sample's image to be recorded via the Windows software interface.
XRF elemental analysis in the field, plant or lab
Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE adds to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants - such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma - the NEX DE is the reliable high performance choice for routine elemental analysis by XRF.
XRF with 60kV X-ray tube and SDD detector
The 60kV X-ray tube and Peltier cooled FAST SDD® Silicon Drift Detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).
XRF options:
Autosampler, helium and standardless FP Options include fundamental parameters, a variety of automatic sample changers, sample spinner and helium purge for enhanced light element sensitivity.
*FAST SDD® is a registered trademark of Amptek, Inc.
Features
  • Analyze ₁₁Na to ₉₂U non-destructively
  • Powerful QuantEZ Windows®-based software
  • High resolution camera
  • 1, 3 or 10 mm analysis spot size
  • Solids, liquids, alloys, powders and films
  • 60kV X-ray tube for wide elemental coverage
  • FAST SDD® detector for superior data
  • Six automated tube filters
  • Unmatched performance-to-price ratio
  • Optional RPF-SQX fundamental parameters
Technical Data

X-ray Tube:
- 60kV X-ray tube, 12W max power
- 7 tube filter positions
- 10 mm collimator

Detector:
- High performance FAST SDD detector
- Peltier thermo-electric cooling
- High spectral resolution with very high count rates

Sample Chamber
- Large 30.5 (W) X 30.5 (D) x 10.5 (H) cm chamber
- Single position 32 or 40 mm sample aperture
- 15-position 32 mm automatic sample changer
- 10-position 40 mm automatic sample changer
- 9-position 50 mm automatic sample changer
- Single position 32 mm sample spinner
- Analysis in air, helium, or vacuum (single position)

Environmental Conditions
Ambient temperature 10-35ºC (50-95ºF)
Relative humidity ≤85% non-condensing

Software & Application Packages
- Qualitative and quantitative analysis
- RPF-SQX fundamental parameters (optional)
- Data export function with LIMS compatibility
- User selectable shaping times
- Simple flow bar wizard to create new applications

User Interface
- QuantEZ software
- External PC computer
- Data export connections

Single phase AC 100/220V, 1.5A (50/60 Hz)

Dimensions: 35.6(W) X 35.1(D) X 26.0(H) cm (14 X 13.8 X 10.2 inch)

Weight: <27 kg (<60 lbs)

Applications
  1. Petroleum
  2. Wood Treatment
  3. Phosphorus Fire Retardant on Fabric
  4. RoHS
  5. Cement
  6. Coatings
  7. Mining & refining
  8. Metals and alloys
  9. Paint and pigments
  10. Education
  11. Catalysts
  12. Wovens and non-wovens

NEX CG
Energy Dispersive X-ray Fluorescence Spectrometer

Advanced Cartesian geometry EDXRF for rapid qualitative and quantitative elemental analysis
Rigaku NEX CG delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — with minimal standards:
- Analyze ₁₁Na to ₉₂U non-destructively
- Solids, liquids, powders and thin films
- Polarized excitation for lower detection limits
- Novel treatment of peak overlap reduces errors
- PPB detection limits for aqueous samples using UltraCarry
- Simplified user interface with EZ Analysis
Polarized cartesian geometry for trace level sensitivity
Unlike conventional EDXRF analyzers, the NEX CG was engineered with a unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. By using secondary target excitation, instead of convention direct excitation, sensitivity is further improved. The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, result in a spectrometer capable of routine trace element analysis even in difficult sample types.
Novel software reduces the need for standards
NEX CG is powered by a new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative analysis of almost all sample types without standards — and rigorous quantitative analysis with standards.
XRF options:
autosampler, vacuum, helium and standardless FP Options include fundamental parameters, a variety of automatic sample changers, sample spinner and helium purge or vacuum atmosphere for enhanced light element sensitivity.
Typical uses of XRF include the analysis of petroleum oils and fuel, plastic, rubber and textiles, pharmaceutical products, foodstuffs, cosmetics and body care products, fertilizers, geological materials, mining feeds, slags and tails, cement, heat-resistant materials, glass, ceramics, catalysts, wafers; the determination of coatings on paper, film, polyester; metals and alloys, glass and plastic; forensics; multi-layer thin films on silicon wafers, photovoltaics and rotating storage media as well as pollution monitoring of solid waste, effluent, cleaning fluids, pools and filters. In addition, X-ray Transmission (XRT) process gauges are employed to measure sulfur (S) in crude oil and marine bunker fuel.
XRF spectrometers are the elemental analysis tool of choice, for many applications, in that they are smaller, simpler in design and cost less to operate than other technologies like inductively coupled plasma optical emission spectroscopy (ICP-OES) and atomic absorption (AA) or atomic fluorescence (AF) spectroscopy. Examples of some common EDXRF applications are: Cement and raw meal: sulfur, iron, calcium, silicon, aluminum, magnesium, etc; Kaolin clay: titanium, iron, aluminum, silicon, etc; Granular catalysts: palladium, platinum, rhodium, ruthenium, etc; Ores: copper, tin, gold, silver, etc; Cement and mortar fillers: sulfur in ash; Gasoline, diesel and RFG: sulfur, manganese, lead, etc; Residual gas oils: sulfur, chlorine, vanadium, nickel, etc; Secondary oil: chlorine, etc; Kerosine, naphtha: sulfur, etc; Crude oil and bunker fuels: sulfur, vanadium, nickel, etc; Plating, pickling & pre-treatment baths: gold, copper, rhodium, platinum, nickel, sulfates, phosphates, chlorides, etc; Acetic acid: magnesium, cobalt and bromine; Terephthalic acid (TPA): cobalt, manganese, iron, etc; Dimethyl terephthalate (DMT): heavy metals; PVC copolymer solutions: chlorine; Photographic emulsion: silver; Clay: metals and non-metals; Waste and effluent streams: RCRA metals, chlorides, phosphates, etc; Food, pet food and other animal feed: potassium, phosphorus and chlorine; Cosmetics: zinc, titanium, calcium, manganese, iron, silicon, phosphorus, sulfur, aluminum, and sodium; Wood treatment: CCA, Penta, ACQ, ACZA, phosphorus-based fire retardants, copper naphthanate, zinc napthanate, TBTO, IPBC and combinations of these; Antacids: calcium; and Toothpaste: phosphorus and tin.
Standardless (FP) Elemental Analysis with EDXRF
Rigaku X-ray spectrometers may be used in conjunction with Fundamental Parameters (FP) software to allow for elemental quantification of completely unknown samples without standards. For example, the Rigaku NEX CG energy dispersive X-ray fluorescence analyzer is powered by a new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative elemental analysis of almost all sample types without standards – and rigorous quantitative analysis with standards.
Featuring Rigaku’s famous Scatter FP method, the software can automatically estimate the elemental concentration of unobserved low atomic number elements (H to F) and provide appropriate corrections. RPF-SQX greatly reduces the number of required standards, for a given level of calibration fit, as compared to conventional EDXRF spectrometric analytical software. As elemental analysis standards are expensive, and can be difficult to obtain for many applications, the utility of RPF-SQX can significantly lower the cost of ownership and reduce workload requirements for routine energy dispersive X-ray fluorescence based elemental analysis.
Cartesian geometry with polarization for highest peak-to-background
Unlike conventional EDXRF analyzers, the NEX CG was engineered with a unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. By using secondary target excitation, instead of conventional direct excitation, sensitivity is further improved.
The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, results in a spectrometer capable of routine trace element analysis even in difficult sample types. Up to five polarization and secondary targets cover the complete elemental range (Na-U) with optimized sensitivity.
As illustrated in the spectral plot (left), cartesian geometry with secondary targets and polarization delivers exceptional signal-to-noise (orange spectrum) as compared to a conventional direct excitation EDXRF system (blue spectrum).
Aqueous Liquid Sample Carrier for PPB-level Trace Element Analysis
With the patented Rigaku UltraCarry, you can use your Rigaku NEX CG spectrometer to quantify trace elements in aqueous liquids down to parts-per-billion (ppb) concentration levels. Routine elemental analysis of contaminated water or industrial wastewater can now be performed without an Atomic Absorption (AA) or Inductively Coupled Plasma (ICP) spectrometer. UltraCarry based trace element analysis is suitable for use by non-technical personnel. - Analyze a wide range of elements (11Na to 92U)
- PPB-level elemental detection limits for aqueous samples
- Simple three-step process: pipette, dry and measure
- Easy-to-use EZ Analysis NEX CG user interface
EDXRF trace element analysis only from Rigaku
UltraCarry is a novel disposable (single-use) sample retainer for X-ray fluorescence (XRF) analysis that is used to preconcentrate a liquid sample into an uniform sample carrier that is optimized for the suppression of background noise. This approach dramatically improves the signal-to-noise ratio, resulting in almost three orders of magnitude improvement in the Lower Limit of Detection (LLD or LOD) and Limit of Quantification (LOQ) for heavy elements.
The UltraCarry sample retainer comprises a ring-shaped support fitted with a X-ray transmissive hydrophobic film and central liquid absorbent element pad. For routine analysis using UltraCarry, a recommended vacuum dryer apparatus — Rigaku UltraDry — is available as an XRF accessory.
Technical Data

Excitation
- X-ray tube with Pd anode
- 50W max power, 50kV max voltage
- Four standard polarization and secondary targets depending on application, for optimum excitation
- Optional fifth target for optimal excitation of Na and Mg

Detector
- High performance SDD, Peltier electronic cooling
- Large active detection area
- Optimum balance of spectral resolution and high count rate

Sample Chamber
- Large 38 cm diameter x 10 cm deep sample chamber for bulk samples
- 15-position automatic sample changer (32mm sample cups)
- 10-position automatic sample changer (35-40mm sample cups and pellets)
- 9-position automatic sample changer with sample spinner
- Analysis in air, helium purge, or vacuum

Environmental Conditions
- Ambient temperature 18-28ºC (65-82ºF)
- Relative humidity ≤75%

Computer
- External PC computer system

Software & Application Packages
- Menu-based software for control of spectrometer functions and data analysis

Application templates
- Simple flow bar wizard to create your own methods
- RPF-SQX FP for qualitative and quantitative analysis
- Matching Library for augmentation of FP
- Automatic spectral overlap deconvolution
- Empirical calibration with overlap and matrix compensation

Single phase AC 100/220V, 15/7A (50/60 Hz)

Dimensions: 60(W) X 60(D) X 40(H) cm (23.6 X 23.6 X 15.7 inch)

Weight: 80 kg (176 lbs)

Options Fifth secondary target for optimum excitation of Na and Mg 9-position automatic sample changer with sample spinner Vacuum system Uninterruptible power supply (UPS) 10-position automatic sample changer

Applications
  1. Sulfur in oil - ASTM D4294, IP 336, ISO 8745, ISO 20847, JIS K 2541-4, ISO 13032, ASTM D7220, EPA ULSD, EPA Tier 3
  2. Lead in Gasoline - ASTM D5059
  3. Chlorine in Crude Oil - ASTM D4929
  4. Lube oils - ASTM D6481, ASTM 7751
  5. Wood Treatment
  6. Phosphorus Fire Retardant on Fabric
  7. Silicone Coating on Paper/Plastic
  8. RoHS
  9. Cement including ASTM C114
  10. Coatings
  11. Mining & refining
  12. Metals and alloys
  13. Paint and pigments
  14. Education
  15. Catalysts
  16. Wovens and non-wovens

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