NEX QC

NEX QC Low Cost Energy Dispersive X-ray Fluorescence Analyzer
As a premium low cost benchtop X-ray Fluorescence (XRF) analyzer, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control elemental analysis applications.
Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, slurries and thin films.

Rigaku NEX QC Energy Dispersive X-ray Fluorescence (EDXRF) Analyzer Delivers Rapid Qualitative And Quantitative Determination Of Major And Minor Atomic Elements In A Wide Variety Of Sample Types:

NEX QC OVERVIEW
EDXRF Optimized for Quality Control Applications
Specifically designed for routine quality control applications, the new Rigaku NEX QC features an intuitive ''icon-driven'' touch screen interface for easy operation and a built-in printer for convenience.

EDXRF With Broad Elemental Coverage
The shuttered 50 kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).

NEX QC Options: Autosampler and Helium Purge Options
Options include automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity. For those applications requiring higher resolution and sensitivity, Rigaku offers the NEX QC+ energy dispersive X-ray fluorescence analyser which is equipped with a silicon drift detector (SDD).

NEX DE

NEX DE
High-Resolution Energy Dispersive X-ray Fluorescence (EDXRF) Spectrometer
Windows®-based EDXRF for rapid elemental analysis
As a premium high performance benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software.

Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, slurries and thin films.

NEX DE Overview
XRF elemental analysis in the field, plant or lab
Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE adds to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications.

Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma - the NEX DE is the reliable high performance choice for routine elemental analysis by XRF.

XRF with 60 kV X-ray tube and SDD detector
The 60 kV X-ray tube and Peltier cooled FAST SDD® Silicon Drift Detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

XRF options: Autosampler, Vacuum, Helium and Standardless FP
Options include fundamental parameters, a variety of automatic sample changers, sample spinner and helium purge or vacuum atmosphere for enhanced light element sensitivity.

NEX CG II Series

NEX CG II Series (NEX CG II & NEX CG II+)
Energy Dispersive X-ray Fluorescence Spectrometer
Next-generation Advanced Cartesian Geometry EDXRF for Rapid Qualitative and Quantitative Elemental Analysis
NEX CG II Series are powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.

Industrial Quality Control to Advanced Research Applications
The Rigaku NEX CG II Series are multi-element, multi-purpose analyzers, ideal for measuring ultra-low and trace element concentrations into the percent levels. These analyzers serve many industries and are especially well-suited for semi-quantitative determination of elemental content in complete unknowns. Applications range from industrial and in-plant quality assurance to research and development. They are easy to use for non-technical operators yet powerful enough for expert use in commercial labs and R&D facilities. Users can achieve the lowest limits of detection and easily manage complex applications.
NEX CG II Series are ideal for testing agricultural soils and plant materials, analyzing finished animal feeds, measuring waste oils, environmental monitoring, pharmaceuticals, cosmetics, and many others.
Available models are NEX CG II for excellent spectral resolution for trace peaks or NEX CG II+ for more demanding applications requiring a higher-powered system.

Cartesian Geometry and Polarization for Trace Level Sensitivity
NEX CG II Series build on NEX CG’s legacy of using Cartesian Geometry and secondary targets for trace-level sensitivity. NEX CG II Series feature a unique and improved close-coupled Cartesian Geometry optical kernel that dramatically increases signal-to-noise ratio and delivers enhanced elemental analysis.
Unlike conventional EDXRF spectrometers, NEX CG II Series are indirect excitation system using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, NEX CG II Series brings a new level of analytical sensitivity to XRF technology. Users can measure ultra-low and trace element concentrations, even in challenging sample types.
NEX CG II Series achieve superior analytical power with either a 50 kV 50 W (NEX CG II) or 65 kV 100 W (NEX CG II+) end-window palladium-anode X-ray tube, five secondary targets covering the complete elemental range sodium through uranium (Na – U), and a high-throughput large-area silicon drift detector (SDD). This unique optical kernel, combined with Rigaku’s advanced RPF-SQX Fundamental Parameters software, delivers the most sensitive EDXRF measurements in the industry.

Easy Instrument Control with Advanced Qualitative and Quantitative Analytical Software
NEX CG II Series are easy to use with QuantEZ, a powerful PC-based software providing intuitive instrument control with simple menu navigation and a customizable EZ Analysis interface. Users can maximize their time and productivity with simplified routine operations and create their own methods using a simple flow bar wizard. In addition, various software options are available to meet user needs, including SureDI, supporting compliance with 21 CFR Part 11.
Advanced qualitative and quantitative analysis is powered by Rigaku’s RPF-SQX Fundamental Parameters (FP) software, featuring Rigaku Profile Fitting (RPF) technology and Scattering FP. This robust integrated software allows semi-quantitative analysis of almost all sample types without standards—and rigorous quantitative analysis with standards. Rigaku’s Scattering FP method automatically estimates the concentration of unmeasurable low atomic number elements (H to F) and provides appropriate corrections.
Calibration standards can be expensive and difficult to obtain for many applications. With RPF-SQX, the number of required standards is greatly reduced, significantly lowering the cost of ownership and reducing workload requirements for running routine analyses.